TSUI, FRANK. F. <br/><br/>
LSI VLSI TESTABILITY DESIGN. 
FRANK. F TSUI 
 - NEW YORK   McGRAW-HILL  1987 
<br/><br/><label>ISBN: </label>0070653410 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Intergrated Circuits.
<br/><br/><label>LC Class. No.: </label>TK 7874 .T78